Hariharan, Parameswaran (1997) Interferometric measurements of small-scale surface irregularities: sources of errors Optical Engineering, 36 (8). pp. 2330-2334. ISSN 0091-3286
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Official URL: http://link.aip.org/link/?OPEGAR/36/2330/1
Related URL: http://dx.doi.org/10.1117/1.601460
Abstract
Interferometry has been used widely to evaluate the large-scale deviations from flatness of optical surfaces. However, when making measurements of small-scale irregularities with very small amplitudes, over a wide range of spatial frequencies, errors can arise due to scattered light and the transfer function of the imaging system. A theoretical analysis of these errors showing how they can be minimized is presented.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to International Society for Optical Engineering. |
| ID Code: | 12602 |
| Deposited On: | 12 Nov 2010 15:41 |
| Last Modified: | 12 Nov 2010 15:41 |
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