Hariharan, Parameswaran (1998) Interferometric measurements of small-scale irregularities: highly reflecting surfaces Optical Engineering, 37 (10). pp. 2751-2753. ISSN 0091-3286
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Official URL: http://link.aip.org/link/?OPEGAR/37/2751/1
Related URL: http://dx.doi.org/10.1117/1.601814
Abstract
With uncoated optical surfaces, it is possible to use a Fizeau interferometer to make direct measurements of small-scale irregularities with very small amplitudes. However, problems arise with highly reflecting surfaces. Some optical systems that can be used for such measurements are described.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to International Society for Optical Engineering. |
| ID Code: | 12595 |
| Deposited On: | 12 Nov 2010 15:42 |
| Last Modified: | 12 Nov 2010 15:42 |
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