Universal correlations between Tc and ns/m(carrier density over effective mass) in high-Tc cuprate superconductors

Uemura, Y. J. ; Luke, G. M. ; Sternlieb, B. J. ; Brewer, J. H. ; Carolan, J. F. ; Hardy, W. N. ; Kadono, R. ; Kempton, J. R. ; Kiefl, R. F. ; Kreitzman, S. R. ; Mulhern, P. ; Riseman, T. M. ; Williams, D. Ll. ; Yang, B. X. ; Uchida, S. ; Takagi, H. ; Gopalakrishnan, J. ; Sleight, A. W. ; Subramanian, M. A. ; Chien, C. L. ; Cieplak, M. Z. ; Xiao, Gang ; Lee, V. Y. ; Statt, B. W. ; Stronach, C. E. ; Kossler, W. J. ; Yu, X. H. (1989) Universal correlations between Tc and ns/m(carrier density over effective mass) in high-Tc cuprate superconductors Physical Review Letters, 62 (19). pp. 2317-2320. ISSN 0031-9007

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Official URL: http://link.aps.org/doi/10.1103/PhysRevLett.62.231...

Related URL: http://dx.doi.org/10.1103/PhysRevLett.62.2317

Abstract

The muon-spin-relaxation rate s has been measured in sixteen specimens of high-Tc cuprate superconductors (the 2:1:4, 1:2:3, 2:2:1:2, and 2:2:2:3 series). This has allowed us to study the magnetic field penetration depth λ and thus the superconducting carrier density ns divided by the effective mass m(σ→1/λ2∝ns/m). A universal linear relation between Tc and σ(T→0)∝ns/m has been found with increasing carrier doping. In heavily doped samples, however, Tc shows saturation and suppression with increasing ns/m. This saturation starts at different values of ns/m for materials with different multiplicities of CuO planes.

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