Jacob, M.V. ; Sundaresan, A. ; Mazierska, J. ; Tanaka, Y. (2005) Investigation Into Microwave Power Dependence of High Quality Tl-1223 Thin Films on LSAT Substrate IEEE Transactions on Applied Superconductivity, 15 (2). pp. 3596-3599. ISSN 1051-8223
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Official URL: http://doi.org/10.1109/TASC.2005.849368
Related URL: http://dx.doi.org/10.1109/TASC.2005.849368
Abstract
The microwave power dependence of high quality Tl(Ba,Sr)/sub 2/Ca/sub 2/Cu/sub 3/O/sub y/ thin films grown on 1'' diameter LSAT substrates using the Amorphous Phase Epitaxy method has been investigated in this paper. We have performed surface resistance (R/sub S/) measurements of Tl-1223 thin films on LSAT using the Hakki-Coleman sapphire dielectric resonator technique in the temperature range 15-94 K. High accuracy in measurements was achieved by using the multi-frequency Transmission Mode Q-Factor Technique. The Tl-1223 films exhibited low surface resistance comparable to YBCO films. When RF power levels were increased the onset of nonlinearity was observed at 0 dBm for all measured temperatures (17, 50, 70 and 84 K).
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to IEEE. |
| ID Code: | 120142 |
| Deposited On: | 23 Jun 2021 06:42 |
| Last Modified: | 23 Jun 2021 06:42 |
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