Enhanced magnetoresistance in nanocrystalline La0.6Pb0.4MnO3 thin films

Singh, Ajay ; Aswal, D. K. ; Viswanadham, C. S. ; Goswami, G. L. ; Gupta, L. C. ; Gupta, S. K. ; Yakhmi, J. V. (2002) Enhanced magnetoresistance in nanocrystalline La0.6Pb0.4MnO3 thin films Journal of Crystal Growth, 244 (3-4). pp. 313-317. ISSN 0022-0248

PDF - Publisher Version

Official URL: http://linkinghub.elsevier.com/retrieve/pii/S00220...

Related URL: http://dx.doi.org/10.1016/S0022-0248(02)01699-8


The nanocrystalline La0.6Pb0.4MnO3 thin films have been grown on (1 0 0) SrTiO3 substrates using pulsed-laser ablation technique. The atomic force microscopy and X-ray diffraction measurements show that the films consist of single-crystalline grains of an average size of ~17 nm with c-axis perpendicular to the substrate plane. These nanocrystalline films exhibit an enhanced magnetoresistance of >100% at 1 T in the vicinity of the Curie temperature. Magnetization data suggest that grain boundaries act as tunnel barriers leading to an enhancement in the magnetoresistance.

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
Keywords:A1. Atomic Force Microscopy; A1. X-ray Diffraction; A3. Laser Epitaxy; B1. Colossal Magnetoresistive Material; B2. Nanocrystalline Films
ID Code:11325
Deposited On:09 Nov 2010 03:34
Last Modified:16 May 2016 20:47

Repository Staff Only: item control page