Sanyal, M .K. ; Sahni, V. C. ; Das, G. P. (1987) A microprocessor based energy Energy Dispersive X-ray Diffractometer Instrumentation Science & Technology, 16 (2). pp. 281-294. ISSN 1073-9149
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Official URL: http://www.tandfonline.com/doi/abs/10.1080/1073914...
Related URL: http://dx.doi.org/10.1080/10739148708543643
Abstract
A microprocessor based Energy Dispersive X-ray Diffraction system is described. The system is built around three 8085 microprocessors and is suitable for performing rapid structural analysis. It can acquire four spectra in programmable memory banks and can do online data analysis. The software includes a nonlinear least square fitting program, which can fit the complete diffraction pattern at a time. To highlight the data processing capabilities of this system, we have presented the results for a simple solid.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Taylor & Francis Group. |
| ID Code: | 111442 |
| Deposited On: | 30 Nov 2017 11:55 |
| Last Modified: | 30 Nov 2017 11:55 |
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