Single-turn fault detection in induction machine using complex-wavelet-based method

Seshadrinath, J. ; Singh, B. ; Panigrahi, B. K. (2012) Single-turn fault detection in induction machine using complex-wavelet-based method IEEE Transactions on Industry Applications, 48 (6). pp. 1846-1854. ISSN 0093-9994

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Official URL: http://ieeexplore.ieee.org/document/6319384/

Related URL: http://dx.doi.org/10.1109/TIA.2012.2222012

Abstract

Interturn short circuit is often confused with voltage imbalance in induction machines. Therefore, detection and classification of single-turn fault (TF) are becoming important in the presence of voltage imbalances, under various loading conditions. Substantial studies are conducted on the interturn fault detection, but a comprehensive method for classifying the faults at different operating points of the machine, under varying supply conditions, is still a challenge. This is a critical problem in industries since the induction motors form the major workhorses. The artificial-intelligence-based techniques are advanced methods in fault monitoring. This, when combined with optimization techniques, is expected to give improved and accurate results with minimum false alarms. In this paper, a technique is developed, based on recent developments in the wavelet-based analysis, particularly in the complex wavelet domain. The support vector machines are adopted for comparing the classification accuracy obtained using complex-wavelet- and standard discrete-wavelet-based methods. The receiver operating characteristic curves indicate that the fault detection, down to single turn, is feasible using a single current sensor.

Item Type:Article
Source:Copyright of this article belongs to Institute of Electrical and Electronics Engineers.
Keywords:Support Vector Machine (SVM); Complex Wavelets; Fault Detection; Feature Extraction; Induction Machines; Supply Imbalance
ID Code:105860
Deposited On:07 Aug 2017 12:27
Last Modified:07 Aug 2017 12:27

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