Microwave surface resistance in Lu1-xPrxBa2Cu3O7−δ thin films

Srinivasu, V. V. ; Raychaudhuri, Pratap ; D'Souza, C. P. ; Pinto, R. ; Vijayaraghavan, R. (1997) Microwave surface resistance in Lu1-xPrxBa2Cu3O7−δ thin films Solid State Communications, 102 (5). pp. 409-412. ISSN 0038-1098

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Official URL: http://www.sciencedirect.com/science/article/pii/S...

Related URL: http://dx.doi.org/10.1016/S0038-1098(97)00005-7


We report microwave surface resistance Rs(T) measurements on Lu1-xPrxBa2Cu3O7−δ thin films in situ grown by Pulsed Laser Deposition (PLD) technique, focussing on the effect of Pr doping in this system. Anomalous peaks in RS(T) plots are observed for both dilute and strong doping concentrations of Pr (x ∼ 0.07 and x ∼ 0.2). Also ageing effects are observed in these films, with a decrease in residual surface resistance and vanishing of the peaks with ageing of these films. We interpret the peaks in RS(T) vs T curve due to the different competing processes involving the temperature dependences of quasi particle scattering time, pair condensation, penetration depth and percolation effects.

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
Keywords:High-Tc Superconductors; Thin Films; Microwave Surface Resistance
ID Code:105212
Deposited On:25 Dec 2017 12:11
Last Modified:25 Dec 2017 12:11

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