Dharmadhikari, C. V. ; Ali, A. O. ; Suresh, N. ; Phase, D. M. ; Chaudhari, S. M. ; Ganesan, V. ; Gupta, A. ; Dasannacharya, B. A. (2000) Dynamic scaling in growth of platinum films on Si(100) Solid State Communications, 114 (7). pp. 377-381. ISSN 0038-1098
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/S00381...
Related URL: http://dx.doi.org/10.1016/S0038-1098(00)00069-7
Abstract
The roughness and general morphology of platinum films grown on Si(100) substrates have been investigated using X-ray Scattering, Scanning Tunneling Microscopy and Atomic Force Microscopy. The results are quantitatively analyzed in terms of height histograms and height-height correlations in the light of dynamical scaling approach. The values of roughness exponent α≅0.7, growth exponent β≅0.52 and dynamical scaling exponent z≅1.4 are in agreement with improvised KPZ exponents based on Kolmogorov's energy cascade concept.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| Keywords: | A. Thin Films; C. Scanning Tunneling Microscopy; C. X-ray Scatteringg |
| ID Code: | 10180 |
| Deposited On: | 03 Nov 2010 04:15 |
| Last Modified: | 28 May 2011 05:35 |
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