Dynamic scaling in growth of platinum films on Si(100)

Dharmadhikari, C. V. ; Ali, A. O. ; Suresh, N. ; Phase, D. M. ; Chaudhari, S. M. ; Ganesan, V. ; Gupta, A. ; Dasannacharya, B. A. (2000) Dynamic scaling in growth of platinum films on Si(100) Solid State Communications, 114 (7). pp. 377-381. ISSN 0038-1098

Full text not available from this repository.

Official URL: http://linkinghub.elsevier.com/retrieve/pii/S00381...

Related URL: http://dx.doi.org/10.1016/S0038-1098(00)00069-7


The roughness and general morphology of platinum films grown on Si(100) substrates have been investigated using X-ray Scattering, Scanning Tunneling Microscopy and Atomic Force Microscopy. The results are quantitatively analyzed in terms of height histograms and height-height correlations in the light of dynamical scaling approach. The values of roughness exponent α≅0.7, growth exponent β≅0.52 and dynamical scaling exponent z≅1.4 are in agreement with improvised KPZ exponents based on Kolmogorov's energy cascade concept.

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
Keywords:A. Thin Films; C. Scanning Tunneling Microscopy; C. X-ray Scatteringg
ID Code:10180
Deposited On:03 Nov 2010 04:15
Last Modified:28 May 2011 05:35

Repository Staff Only: item control page