Koushik, R. ; Baenninger, Matthias ; Narayan, Vijay ; Mukerjee, Subroto ; Pepper, Michael ; Farrer, Ian ; Ritchie, David A. ; Ghosh, Arindam (2013) Topological excitations in semiconductor heterostructures AIP Conference Proceedings, 1566 (1). pp. 265-266. ISSN 1551-7616
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Official URL: http://aip.scitation.org/doi/abs/10.1063/1.4848387
Related URL: http://dx.doi.org/10.1063/1.4848387
Abstract
Topological defects play an important role in the melting phenomena in two-dimensions. In this work, we report experimental observation of topological defect induced melting in two-dimensional electron systems (2DES) in the presence of strong Coulomb interaction and disorder. The phenomenon is characterised by measurement of conductivity which goes to zero in a Berezinskii-Kosterlitz-Thouless like transition. Further evidence is provided via low-frequency conductivity noise measurements.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 101514 |
| Deposited On: | 01 Feb 2018 10:04 |
| Last Modified: | 01 Feb 2018 10:04 |
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