Swift heavy ion induced interface modification in Ni/Ge

Som, T. ; Satpati, B. ; Satyam, P. V. ; Kabiraj, D. ; Ayyub, P. ; Ghosh, S. ; Gupta, Ajay ; Dev, B. N. ; Avasthi, D. K. (2003) Swift heavy ion induced interface modification in Ni/Ge Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 212 . pp. 206-210. ISSN 0168-583X

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Official URL: http://linkinghub.elsevier.com/retrieve/pii/S01685...

Related URL: http://dx.doi.org/10.1016/S0168-583X(03)01734-8


This paper reports on the formation of Ni2Ge alloy through interface modification of Ni/Ge bilayer structure using 100 MeV Au-ion irradiation at different temperatures and fluences. Compositional analysis and calculation of mixing efficiency were performed by Rutherford backscattering spectrometry. High resolution cross-sectional transmission electron microscopy was carried out for thickness determination and structure determination. Alloy formation has been discussed on the basis of swift heavy ion irradiation induced effects.

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
Keywords:Swift Heavy Ion Irradiation; Alloy Formation; Electron Microscopy
ID Code:10087
Deposited On:02 Nov 2010 09:50
Last Modified:30 May 2011 05:49

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