Hazra, Aritra ; Ghosh, Priyankar ; Vadlamudi, S. G. ; Chakrabarti, P. P. ; Dasgupta, Pallab (2013) Formal methods for early analysis of functional reliability in component-based embedded applications IEEE Embedded Systems Letters, 5 (1). pp. 8-11. ISSN 1943-0663
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Official URL: http://ieeexplore.ieee.org/document/6409980/
Related URL: http://dx.doi.org/10.1109/LES.2013.2239605
Abstract
We present formal methods for determining whether a set of components with given reliability certificates for specific functional properties are adequate to guarantee desired end-to-end properties with specified reliability requirements. We introduce a formal notion for the reliability gap in component-based designs and demonstrate the proposed approach for analyzing this gap using a case study developed around an Elevator Control System.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Institute of Electrical and Electronics Engineers. |
| Keywords: | Reliability Gap; Design and Validation; Embedded System; Functional Reliability |
| ID Code: | 100848 |
| Deposited On: | 12 Dec 2016 12:03 |
| Last Modified: | 12 Dec 2016 12:03 |
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