Ion-beam-induced embedded nanostructures and nanoscale mixing

Satpati, B. ; Satyam, P. V. ; Som, T. ; Dev, B. N. (2004) Ion-beam-induced embedded nanostructures and nanoscale mixing Journal of Applied Physics, 96 (9). pp. 5212-5216. ISSN 0021-8979

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Megaelectron volts ion-induced effects for discontinuous gold nanoislands and for continuous gold films on silicon substrate have been studied. Irradiation was carried out with 1.5 MeV Au2+ ions at room temperature to various fluences. Cross-sectional transmission electron microscopy and Rutherford backscattering spectrometry are used to study the ion-beam mixing in Au/Si systems. At a fluence of 1× 1014 ions cm-2, a material push-in effect and a metastable Au-Si phase formation have been observed for Au nanoislands, while no push in or mixing has been observed for the case of continuous films. The mixed phase of Au-Si system is found to be crystalline in nature. The material push- in and ion-beam mixing effects that are observed in case of nanoislands appear to be due to combined effect of capillary driving force, ion-induced viscous flow, and ion-induced energy spike effects.

Item Type:Article
Source:Copyright of this article belongs to American Institute of Physics.
Keywords:Gold; Ion Beam Mixing; Discontinuous Metallic Thin Films; Nanoparticles; Capillarity; Transmission Electron Microscopy; Rutherford Backscattering
ID Code:10034
Deposited On:02 Nov 2010 10:04
Last Modified:30 May 2011 05:46

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