Items where Author is "Chakrapani, Sunil Kishore"

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Article

Chakrapani, Sunil Kishore ; Padiyar, M. Janardhan ; Balasubramanian, Krishnan (2011) Crack Detection in Full Size Cz-Silicon Wafers Using Lamb Wave Air Coupled Ultrasonic Testing (LAC-UT) Journal of Nondestructive Evaluation, 31 (1). pp. 46-55. ISSN 0195-9298

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