Items where Author is "Chakrapani, Sunil Kishore"Group by: Item Type | No Grouping Number of items: 1. Chakrapani, Sunil Kishore ; Padiyar, M. Janardhan ; Balasubramanian, Krishnan (2011) Crack Detection in Full Size Cz-Silicon Wafers Using Lamb Wave Air Coupled Ultrasonic Testing (LAC-UT) Journal of Nondestructive Evaluation, 31 (1). pp. 46-55. ISSN 0195-9298 |
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