Items where Author is "Zeitzoff, P."Group by: Item Type | No Grouping Jump to: Article Number of items: 1. ArticleInani, A. ; Rao, V. R. ; Cheng, B. ; Zeitzoff, P. ; Woo, J. C. S. (1999) Capacitance degradation due to fringing field in deep sub-micron MOSFETs with high-K gate dielectrics 29th European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium . pp. 160-163. |
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