Items where Author is "Werking, J. D."

Brozek, T. ; Rao, V. R. ; Sridharan, A. ; Werking, J. D. ; Chan, Y. D. ; Viswanathan, C. R. (1998) Charge injection using gate-induced-drain-leakage current for characterization of plasma edge damage in CMOS devices IEEE Transactions on Semiconductor Manufacturing, 11 (2). pp. 211-216. ISSN 0894-6507