Items where Author is "Vasi, Juzer"

Article

Sandhya, C. ; Oak, Apoorva B. ; Chattar, Nihit ; Ganguly, Udayan ; Olsen, C. ; Seutter, S. M. ; Date, L. ; Hung, R. ; Vasi, Juzer ; Mahapatra, Souvik (2010) Study of P/E cycling endurance induced degradation in SANOS memories under NAND (FN/FN) operation IEEE Transactions on Electron Devices, 57 (7). pp. 1548-1558. ISSN 0018-9383

Sandhya, C. ; Oak, Apoorva B. ; Chattar, Nihit ; Joshi, Ameya S. ; Ganguly, Udayan ; Olsen, C. ; Seutter, S. M. ; Date, L. ; Hung, R. ; Vasi, Juzer ; Mahapatra, Souvik (2009) Impact of SiN composition variation on SANOS memory performance and reliability under NAND (FN/FN) operation IEEE Transactions on Electron Devices, 56 (12). pp. 3123-3132. ISSN 0018-9383

Hariharan, Venkatnarayan ; Thakker, Rajesh ; Singh, Karmvir ; Sachid, Angada B. ; Patil, M. B. ; Vasi, Juzer ; Ramgopal Rao, V. (2009) Drain current model for nanoscale double-gate MOSFETs Solid-State Electronics, 53 (9). pp. 1001-1008. ISSN 0038-1101

Hariharan, Venkatnarayan ; Vasi, Juzer ; Ramgopal Rao, V. (2009) A CAD-compatible closed form approximation for the inversion charge areal density in double-gate MOSFETs Solid-State Electronics, 53 (2). pp. 218-224. ISSN 0038-1101

Hariharan, V. ; Vasi, Juzer ; Ramgopal Rao, V. (2007) Drain current model for undoped symmetric double-gate FETs using a velocity saturation model with exponent n=2 Proceedings of the 2007 International Semiconductor Device Research Symposium (ISDRS), Universit of Maryland, College Park, USA . pp. 1-2.