Items where Author is "Vasi, J. M."

Article

Sandhya, C. ; Ganguly, U. ; Chattar, N. ; Olsen, C. ; Seutter, S. M. ; Date, L. ; Hung, R. ; Vasi, J. M. ; Mahapatra, S. (2009) Effect of SiN on Performance and Reliability of Charge Trap Flash (CTF) under Fowler–Nordheim tunneling program/erase operation IEEE Electron Device Letters, 30 (2). pp. 171-173. ISSN 0741-3106

Mahapatra, S. ; Rao, V. R. ; Cheng, B. ; Khare, M. ; Parikh, C. D. ; Woo, J. C. S. ; Vasi, J. M. (2001) Performance and hot-carrier reliability of 100 nm channel length jet vapor deposited Si₃N₄ MNSFETs IEEE Transactions on Electron Devices, 48 (4). pp. 679-684. ISSN 0018-9383