Items where Author is "Suresh, Nived"Group by: Item Type | No Grouping Jump to: Article Number of items: 3. ArticleSuresh, Nived ; Balasubramanian, Krishnan (2023) Cut-off thickness identification of defects with single and two-step geometries using SH1 mode conversion Journal of Nondestructive Evaluation, 43 (1). ISSN 0195-9298 Suresh, Nived ; Balasubramanian, Krishnan (2022) Remnant thickness quantification in small thickness structures utilising the cut-off property of A1 Lamb wave mode employing linear array elements Journal of Applied Physics, 131 (17). ISSN 0021-8979 Suresh, Nived ; Balasubramanian, Krishnan (2020) Quantifying the lowest remnant thickness using a novel broadband wavelength and frequency EMAT utilizing the cut-off property of guided waves NDT & E International, 116 . p. 102313. ISSN 0963-8695 |

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