Items where Author is "Sudan, Madhu"Group by: Item Type | No Grouping Jump to: Conference or Workshop Item Number of items: 1. Conference or Workshop ItemHarsha, Prahladh ; Kumar, Mrinal ; Saptharishi, Ramprasad ; Sudan, Madhu (2024) An improved line-point low-degree test* In: 2024 IEEE 65th Annual Symposium on Foundations of Computer Science (FOCS), 27-30 October 2024, Chicago, IL, USA. |
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