Items where Author is "Southwick, Richard G."

Article

Parihar, Narendra ; Sharma, Uma ; Southwick, Richard G. ; Wang, Miaomiao ; Stathis, James H. ; Mahapatra, Souvik (2018) Ultrafast measurements and physical modeling of NBTI stress and recovery in RMG FinFETs under diverse DC–AC experimental conditions IEEE Transactions on Electron Devices, 65 (1). pp. 23-30. ISSN 0018-9383

Conference or Workshop Item

Parihar, Narendra ; Southwick, Richard G. ; Sharma, Uma ; Wang, Miaomiao ; Stathis, James H ; Mahapatra, Souvik (2017) Comparison of DC and AC NBTI kinetics in RMG Si and SiGe p-FinFETs In: 2017 IEEE International Conference on Reliability Physics Symposium (IRPS), 2-6 April 2017, Monterey, CA, USA.