Items where Author is "Simoen, E."

Article

Maji, D. ; Crupi, F. ; Magnone, P. ; Giusi, G. ; Pace, C. ; Simoen, E. ; Rao, V. R. (2009) Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique Proceedings of the IEEE International Workshop on Electron Devices & Semiconductor Technology, Mumbai, India . pp. 1-4.

Magnone, P. ; Crupi, F. ; Giusi, G. ; Pace, C. ; Simoen, E. ; Claeys, C. ; Pantisano, L. ; Maji, D. ; Rao, V. R. ; Srinivasan, P. (2009) 1/f Noise in drain and gate current of MOSFETs with high-k gate stacks IEEE Transactions on Device and Materials Reliability, 9 (2). pp. 180-189. ISSN 1530-4388

Maji, D. ; Crupi, F. ; Amat, E. ; Simoen, E. ; De Jaeger, B. ; Brunco, D. P. ; Manoj, C. R. ; Rao, V. R. ; Magone, P. ; Guisi, G. ; Pace, C. ; Pantisano, L. ; Mitard, J. ; Rodriguez, R. ; Nafria, M. (2009) Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs IEEE Transactions on Electron Devices, 56 (5). pp. 1063-1069. ISSN 0018-9383