Items where Author is "Sandhya, C."

Article

Sandhya, C. ; Oak, Apoorva B. ; Chattar, Nihit ; Ganguly, Udayan ; Olsen, C. ; Seutter, S. M. ; Date, L. ; Hung, R. ; Vasi, Juzer ; Mahapatra, Souvik (2010) Study of P/E cycling endurance induced degradation in SANOS memories under NAND (FN/FN) operation IEEE Transactions on Electron Devices, 57 (7). pp. 1548-1558. ISSN 0018-9383

Sandhya, C. ; Oak, Apoorva B. ; Chattar, Nihit ; Joshi, Ameya S. ; Ganguly, Udayan ; Olsen, C. ; Seutter, S. M. ; Date, L. ; Hung, R. ; Vasi, Juzer ; Mahapatra, Souvik (2009) Impact of SiN composition variation on SANOS memory performance and reliability under NAND (FN/FN) operation IEEE Transactions on Electron Devices, 56 (12). pp. 3123-3132. ISSN 0018-9383

Sandhya, C. ; Ganguly, U. ; Chattar, N. ; Olsen, C. ; Seutter, S. M. ; Date, L. ; Hung, R. ; Vasi, J. M. ; Mahapatra, S. (2009) Effect of SiN on Performance and Reliability of Charge Trap Flash (CTF) under Fowler–Nordheim tunneling program/erase operation IEEE Electron Device Letters, 30 (2). pp. 171-173. ISSN 0741-3106

Conference or Workshop Item

Singh, Pawan ; Sandhya, C. ; Auluck, Kshitij ; Bisht, Gaurav ; Sivatheja, M. ; Mukhopadhyay, Gautam ; Mahapatra, Souvik ; Hofmann, Ralf (2010) Applicability of dual layer metal nanocrystal flash memory for NAND 2 or 3-bit/cell operation: Understanding the anomalous breakdown and optimization of P/E conditions In: 2010 IEEE International Conference on Reliability Physics Symposium (IRPS), 2-6 May, 2010, Anaheim, CA, USA.

Singh, Pawan K ; Bisht, Gaurav ; Sivatheja, M. ; Sandhya, C. ; Mukhopadhyay, Gautam ; Mahapatra, Souvik ; Hofmann, Ralf ; Singh, Kaushal ; Krishna, Nety (2009) Reliability of single and dual Layer Pt nanocrystal devices for NAND flash applications: A 2-region model for endurance defect generation In: 2009 IEEE International Reliability Physics Symposium, 26-30 April, 2009, Montreal, QC, Canada.

Sandhya, C. ; Ganguly, U. ; Singh, K. K. ; Singh, P. K. ; Olsen, C. ; Seutter, S. M. ; Hung, R. ; Conti, G. ; Ahmed, K. ; Krishna, N. ; Vasi, J. ; Mahapatra, S. (2008) Nitride engineering and the effect of interfaces on Charge Trap Flash performance and reliability In: 2008 IEEE International Reliability Physics Symposium, IRPS 2008, 27 April-1 May, 2008, Phoenix, AZ, USA.

Sandhya, C. ; Ganguly, U. ; Singh, K. K. ; Olsen, C. ; Seutter, S. M. ; Conti, G. ; Ahmed, K. ; Krishna, N. ; Vasi, J. ; Mahapatra, S. (2008) The effect of band gap engineering of the nitride storage node on performance and reliability of charge trap flash In: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2008, 7-11 July, 2008, Singapore, Singapore.