Items where Author is "Sachdev, R."Group by: Item Type | No Grouping Jump to: Article Number of items: 1. ArticleSachdev, R. ; Wijeratne, G. ; Ramgopal Rao, V. ; Viswanathan, C. R. (1998) A study of the effect of plasma etch damage on sub-micron MOSFET's flicker noise properties Technical Digest, 28th European Solid-State Device Research Conference (ESSDERC), Bordeaux, France . pp. 572-575. |
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