Items where Author is "Russ, C."

Shrivastava, M. ; Verma, B. ; Baghini, M. S. ; Russ, C. ; Sharma, D. K. ; Gossner, H. ; Rao, V. R. (2009) Benchmarking the device performance at sub 22 nm node technologies using an SoC framework Proceedings of the International Electron Devices Meeting (IEDM) . pp. 1-4.