Items where Author is "Rao, M. V. H."Group by: Item Type | No Grouping Jump to: Article Number of items: 8. ArticleSrinivas, V. ; Ayyar, S. R. ; Rao, M. V. H. ; Mathur, B. K. ; Chopra, K. L. (1996) Fractal analysis of field induced effects on thin films of nickel Materials Research Bulletin, 31 (2). pp. 197-205. ISSN 0025-5408 Rao, M. V. H. ; Mathur, B. K. ; Chopra, K. L. (1996) Detection of surface lattice defects using line scan method Bulletin of Materials Science, 19 (2). pp. 417-422. ISSN 0250-4707 Rao, M. V. H. ; Srinivas, V. ; Rao, V. V. ; Mathur, B. K. ; Chopra, K. L. (1995) Observation of field-induced fragmentation of nickel clusters using scanning tunneling microscopy Applied Surface Science, 89 (4). pp. 417-421. ISSN 0169-4332 Rao, M. V. H. ; Mathur, B. K. ; Chopra, K. L. (1995) Scanning tunnelling microscopy studies of nucleation and growth of silver films Journal of Materials Science, 30 (10). pp. 2682-2685. ISSN 0022-2461 Srinivas, V. ; Rao, M. V. H. ; Mathur, B. K. ; Chopra, K. L. (1994) Creation of nanostructures on nickel thin films by STM Bulletin of Materials Science, 17 (6). pp. 841-848. ISSN 0250-4707 Rao, M. V. H. ; Mathur, B. K. ; Chopra, K. L. (1994) Evaluation of the scaling exponent of self-affine fractal surface from a single scanning probe microscope image Applied Physics Letters, 65 (1). pp. 124-126. ISSN 0003-6951 Rao, M. V. H. ; Mishra, S. K. ; Pathak, L. C. ; Mathur, B. K. ; Bhattacharya, D. ; Chopra, K. L. (1993) Interlocked grain growth of YBCO film on magnesium oxide as observed by scanning tunneling microscopy Materials Research Bulletin, 28 (3). pp. 271-277. ISSN 0025-5408 Rao, M. V. H. ; Mathur, B. K. ; Chopra, K. L. (1992) Method of identification of electronically different surface atoms by scanning tunneling microscopy and surface state spectroscopy of the graphite(0001) surface Journal of Electron Spectroscopy and Related Phenomena, 60 (1). pp. 57-63. ISSN 0368-2048 |

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