Items where Author is "Mohapatra, N .R."

Conference or Workshop Item

Nair, D. R. ; Mohapatra, N .R. ; Mahapatra, S. ; Shukuri, S. ; Bude, J. (2003) The effect of CHE and CHISEL programming operation on drain disturb in flash EEPROMs In: Proceedings of the 2003 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2003, 11-11 July, 2003, Singapore, Singapore.