Items where Author is "Mishra, Subrat"

Article

Mishra, Subrat ; Wong, Hiu Yung ; Tiwari, Ravi ; Chaudhary, Ankush ; Rao, Rakesh ; Moroz, Victor ; Mahapatra, Souvik (2016) TCAD-based predictive NBTI framework for sub-20-nm node device design considerations IEEE Transactions on Electron Devices, 63 (12). pp. 4624-4631. ISSN 0018-9383

Mishra, Subrat ; Mahapatra, Souvik (2016) On the impact of time-zero variability, variable NBTI and stochastic TDDB on SRAM cells IEEE Transactions on Electron Devices, 63 (7). pp. 2764-2770. ISSN 0018-9383

Conference or Workshop Item

Mahapatra, Souvik ; Parihar, Narendra ; Mishra, Subrat ; Fernandez, Beryl ; Chaudhary, Ankush (2017) A BTI Analysis Tool (BAT) to simulate p-MOSFET ageing under diverse experimental conditions In: 2017 IEEE Conference on Electron Devices Technology and Manufacturing Conference (EDTM), 28 Feb.-2 March 2017, Toyama, Japan.

Wong, Hiu Yung ; Motzny, Steve ; Moroz, Victor ; Mishra, Subrat ; Mahapatra, Souvik (2017) FinFET NBTI degradation reduction and recovery enhancement through hydrogen incorporation and self-heating In: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 7-9 Sept. 2017, Kamakura, Japan.

Amrouch, Hussam ; Mishra, Subrat ; van Santen, Victor ; Mahapatra, Souvik ; Henkel, Jorg (2017) Impact of BTI on dynamic and static power: From the physical to circuit level In: 2017 IEEE International Conference on Reliability Physics Symposium (IRPS), 2-6 April 2017, Monterey, CA, USA.

Mishra, Subrat ; Wong, Hiu Yung ; Tiwari, Ravi ; Chaudhary, Ankush ; Parihar, Narendra ; Rao, Rakesh ; Motzny, Steve ; Moroz, Victor ; Mahapatra, Souvik (2017) Predictive TCAD for NBTI stress-recovery in various device architectures and channel materials In: 2017 IEEE International Conference on Reliability Physics Symposium (IRPS), 2-6 April 2017, Monterey, CA, USA.