Items where Author is "Masuduzzaman, Muhammad"Group by: Item Type | No Grouping Number of items: 1. Yang, Jiaqi ; Masuduzzaman, Muhammad ; Joshi, Kaustubh ; Mukhopadhyay, Subhadeep ; Kang, Jinfeng ; Mahapatra, Souvik ; Alam, Muhammad A. (2012) Intrinsic correlation between PBTI and TDDB degradations in nMOS HK/MG dielectrics In: 2012 IEEE International Conference on Reliability Physics Symposium (IRPS), 15-19 April, 2012, Anaheim, CA, USA. |
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