Items where Author is "Manoj, C. R."

Article

Chabukswar, S. ; Maji, D. ; Manoj, C. R. ; Anil, K. G. ; Ramgopal Rao, V. ; Crupi, F. ; Magnone, P. ; Giusi, G. ; Pace, C. ; Collaert, N. (2010) Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs Microelectronic Engineering, 87 (10). pp. 1963-1967. ISSN 0167-9317

Manoj, C. R. ; Sachid, A. B. ; Feng, Yuan ; Chang-Yun, Chang ; Rao, V. R. (2010) Impact of fringe capacitance on the performance of nanoscale FinFETs IEEE Electron Device Letters, 31 (1). pp. 83-85. ISSN 0741-3106

Maji, D. ; Crupi, F. ; Amat, E. ; Simoen, E. ; De Jaeger, B. ; Brunco, D. P. ; Manoj, C. R. ; Rao, V. R. ; Magone, P. ; Guisi, G. ; Pace, C. ; Pantisano, L. ; Mitard, J. ; Rodriguez, R. ; Nafria, M. (2009) Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs IEEE Transactions on Electron Devices, 56 (5). pp. 1063-1069. ISSN 0018-9383

Manoj, C. R. ; Nagpal, M. ; Varghese, D. ; Rao, V. R. (2008) Device design and optimization considerations for bulk FinFETs IEEE Transactions on Electron Devices, 55 (2). pp. 609-615. ISSN 0018-9383

Sachid, A. B. ; Manoj, C. R. ; Sharma, D. K. ; Rao, V. R. (2008) Gate fringe-induced barrier lowering in underlap FinFET structures and its optimization IEEE Electron Device Letters, 29 (1). pp. 128-130. ISSN 0741-3106

Manoj, C. R. ; Nagpal, M. ; Ramgopal Rao, V. (2007) Improving the DC performance of Bulk FinFETs by optimum body doping Proceedings of the 14th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Bangalore, India . pp. 180-184.

Manoj, C. R. ; Rao, V. R. (2007) Impact of high-k gate dielectrics on the device and circuit performance of nanoscale FinFETs IEEE Electron Device Letters, 28 (4). pp. 295-297. ISSN 0741-3106