Items where Author is "ManjulaRani, K. N."

Article

ManjulaRani, K. N. ; Ramgopal Rao, V. ; Vasi, J. (2003) Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing IEEE Transactions on Device and Materials Reliability . pp. 168-172.

ManjulaRani, K. N. ; Rao, V. R. ; Vasi, J. (2003) A new method to characterize border traps in sub-micron transistors using hysteresis in the drain current IEEE Transactions on Electron Devices, 50 (4). pp. 973- 979. ISSN 0018-9383

ManjulaRani, K. N. ; Ramgopal Rao, V. ; Vasi, J. (2002) Degradation study of ultra-thin JVD silicon nitride MNSFETs MRS Proceedings, 716 . pp. B4.18_1-B4.18_6. ISSN 1946-4274

ManjulaRani, K. N. ; Ramgopal Rao, V. ; Vasi, J. (2002) High field stressing effects in JVD Nitride capacitors Proceedings of the 11th International Workshop on the Physics of Semiconductor Devices, 4746 (2). pp. 1316-1319. ISSN 1017-2653

Mutha, Yatin ; ManjulaRani, K. N. ; Lal, Rakesh ; Ramgopal Rao, V. (2002) Polarity dependence of degradation in ultra thin oxide and JVD nitride gate dielectrics MRS Proceedings, 716 . pp. B7-22_1-B7-22_6. ISSN 1946-4274