Items where Author is "Magnone, P."

Article

Chabukswar, S. ; Maji, D. ; Manoj, C. R. ; Anil, K. G. ; Ramgopal Rao, V. ; Crupi, F. ; Magnone, P. ; Giusi, G. ; Pace, C. ; Collaert, N. (2010) Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs Microelectronic Engineering, 87 (10). pp. 1963-1967. ISSN 0167-9317

Maji, D. ; Crupi, F. ; Magnone, P. ; Giusi, G. ; Pace, C. ; Simoen, E. ; Rao, V. R. (2009) Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique Proceedings of the IEEE International Workshop on Electron Devices & Semiconductor Technology, Mumbai, India . pp. 1-4.

Magnone, P. ; Crupi, F. ; Giusi, G. ; Pace, C. ; Simoen, E. ; Claeys, C. ; Pantisano, L. ; Maji, D. ; Rao, V. R. ; Srinivasan, P. (2009) 1/f Noise in drain and gate current of MOSFETs with high-k gate stacks IEEE Transactions on Device and Materials Reliability, 9 (2). pp. 180-189. ISSN 1530-4388