Items where Author is "Lwin, Z. Z."

Article

Lwin, Z. Z. ; Pey, K. L. ; Zhang, Q. ; Bosman, M. ; Liu, Q. ; Gan, C. L. ; Singh, P. K. ; Mahapatra, S. (2012) Study of charge distribution and charge loss in dual-layer metal-nanocrystal-embedded high-κ/SiO₂ gate stack Applied Physics Letters, 100 (19). Article ID 193109. ISSN 0003-6951

Chen, Y. N. ; Goh, K. E. J. ; Wu, X. ; Lwin, Z. Z. ; Singh, P. K. ; Mahapatra, S. ; Pey, K. L. (2012) Temperature-dependent relaxation current on single and dual layer Pt metal nanocrystal-based Al₂O₃/SiO₂ gate stack Journal of Applied Physics, 112 (10). Article ID 104503. ISSN 0021-8979

Lwin, Z. Z. ; Pey, K. L. ; Liu, C. ; Liu, Q. ; Zhang, Q. ; Chen, Y. N. ; Singh, P. K. ; Mahapatra, S. (2011) Localized charge trapping and lateral charge diffusion in metal nanocrystal-embedded High-κ/SiO₂ gate stack Applied Physics Letters, 99 (22). Article ID 222102. ISSN 0003-6951

Chen, Y. N. ; Pey, K. L. ; Goh, K. E. J. ; Lwin, Z. Z. ; Singh, P. ; Mahapatra, S. (2011) Study of automatic recovery on the metal nanocrystal-based Al₂O₃/SiO₂ gate stack Applied Physics Letters, 98 (8). Article ID 083504. ISSN 0003-6951

Chen, Y. N. ; Pey, K. L. ; Goh, K. E. J. ; Lwin, Z. Z. ; Singh, P. K. ; Mahapatra, S. (2010) Tri-Level resistive switching in metal-nanocrystal-based Al₂O₃/SiO₂ gate stack IEEE Transactions on Electron Devices, 57 (11). pp. 3001-3005. ISSN 0018-9383

Conference or Workshop Item

Lwin, Z. Z. ; Pey, K. L. ; Chen, Y. N. ; Singh, P. K. ; Mahapatra, S. (2010) Charging and discharging characteristics of metal nanocrystals in degraded dielectric stacks In: 2010 IEEE International Conference on Reliability Physics Symposium (IRPS), 2-6 May, 2010, Anaheim, CA, USA.