Items where Author is "Kumar, Aatish"

Kumar, Aatish ; Lal, Rakesh ; Ramgopal Rao, V. (2001) A simple and direct technique for interface characterization of SOI MOSFETs and its application in hot carrier degradation studies in sub-100 nm JVD MNSFETs Microelectronic Engineering, 59 (1-4). pp. 429-433. ISSN 0167-9317