Items where Author is "Krishna, Nety"

Singh, Pawan K. ; Hofmann, Ralf ; Singh, Kaushal K. ; Krishna, Nety ; Mahapatra, Souvik (2009) Performance and reliability of Au and Pt single-layer metal nanocrystal flash memory under NAND (FN/FN) operation IEEE Transactions on Electron Devices, 56 (9). pp. 2065-2072. ISSN 0018-9383

Singh, Pawan K ; Bisht, Gaurav ; Sivatheja, M. ; Sandhya, C. ; Mukhopadhyay, Gautam ; Mahapatra, Souvik ; Hofmann, Ralf ; Singh, Kaushal ; Krishna, Nety (2009) Reliability of single and dual Layer Pt nanocrystal devices for NAND flash applications: A 2-region model for endurance defect generation In: 2009 IEEE International Reliability Physics Symposium, 26-30 April, 2009, Montreal, QC, Canada.

Singh, Pawan K. ; Bisht, Gaurav ; Hofmann, Ralf ; Singh, Kaushal ; Krishna, Nety ; Mahapatra, Souvik (2008) Metal nanocrystal memory with pt single- and dual-layer NC with low-leakage Al₂O₃ blocking dielectric IEEE Electron Device Letters, 29 (12). pp. 1389-1391. ISSN 0741-3106

Singh, Pawan K. ; Singh, Kaushal K. ; Hofmann, Ralf ; Armstrong, Karl ; Krishna, Nety ; Mahapatra, Souvik (2008) Au nanocrystal flash memory reliability and failure analysis In: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2008, 7-11 July, 2008, Singapore, Singapore.