Items where Author is "Kamohara, S."

Article

Kumar, P. B. ; Nair, P. R. ; Sharma, R. ; Kamohara, S. ; Mahapatra, S. (2006) Lateral profiling of trapped charge in SONOS flash EEPROMs programmed using CHE injection IEEE Transactions on Electron Devices, 53 (4). pp. 698-705. ISSN 0018-9383

Conference or Workshop Item

Bharath Kumar, P. ; Murakami, E. ; Kamohara, S. ; Mahapatra, S. (2006) Endurance and retention characteristics of SONOS EEPROMs operated using BTBT induced hot hole erase In: 2006 44th Annual IEEE International Reliability Physics Symposium Proceedings, 26-30 March, 2006, San Jose, CA, USA.

Sridhar, K. ; Bharath Kumar, P. ; Mahapatra, S. ; Murakami, E. ; Kamohara, S. (2005) Controlling injected electron and hole profiles for better reliability of split gate SONOS In: 2005 Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2005, 27 June-1 July, 2005, Singapore, Singapore.

Kumar, P. B. ; Sharma, R. ; Nair, P. R. ; Nair, D. R. ; Kamohara, S. ; Mahapatra, S. ; Vasi, J. (2005) Mechanism of drain disturb in SONOS flash EEPROMs In: 2005 43rd Annual IEEE International Reliability Physics Symposium. Proceedings, 17-21 April, 2005, San Jose, CA, USA.

Nair, P. R. ; Kumar, B. ; Sharma, R. ; Mahapatra, S. ; Kamohara, S. (2004) A comprehensive trapped charge profiling technique for SONOS flash EEPROMs In: 2004 IEEE International Electron Devices Meeting, IEDM Technical Digest, 13-15 Dec, 2004, San Francisco, CA, USA.