Items where Author is "Joshi, K."

Article

Goel, N. ; Joshi, K. ; Mukhopadhyay, S. ; Nanaware, N. ; Mahapatra, S. (2014) A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs Microelectronics Reliability, 54 (3). pp. 491-519. ISSN 0026-2714

Mahapatra, S. ; Goel, N. ; Desai, S. ; Gupta, S. ; Jose, B. ; Mukhopadhyay, S. ; Joshi, K. ; Jain, A. ; Islam, A. E. ; Alam, M. A. (2013) A comparative study of different physics-based NBTI models IEEE Transactions on Electron Devices, 60 (3). pp. 901-916. ISSN 0018-9383

Joshi, K. ; Hung, S. ; Mukhopadhyay, S. ; Sato, T. ; Bevan, M. ; Rajamohanan, B. ; Wei, A. ; Noori, A. ; McDougall, B. ; Ni, C. ; Lazik, C. ; Saheli, G. ; Liu, P. ; Chu, D. ; Date, L. ; Datta, S. ; Brand, A. ; Swenberg, J. ; Mahapatra, S. (2013) Scaled gate stacks for sub-20-nm CMOS logic applications through integration of thermal IL and ALD HfOx IEEE Electron Device Letters, 34 (1). pp. 3-5. ISSN 0741-3106

Gupta, R. ; Gupta, S. ; Joshi, K. ; Ganguly, N. K. (1997) Role of iron and iron chelation therapy in oxygen free radical mediated tissue injury in an ascending mouse model of chronic pyelonephritis Comparative Immunology, Microbiology and Infectious Diseases, 20 (4). pp. 299-307. ISSN 0147-9571

Kaur, M. ; Joshi, K. ; Ganguly, N. K. ; Mahajan, R. C. ; Malla, N. (1995) Evaluation of the efficacy of albendazole against the larvae of Taenia solium in experimentally infected pigs, and kinetics of the immune response International Journal for Parasitology, 25 (12). pp. 1443-1450. ISSN 0020-7519

Conference or Workshop Item

Mukhopadhyay, S. ; Joshi, K. ; Chaudhary, V. ; Goel, N. ; De, S. ; Pandey, R. K. ; Murali, K. V. R. M. ; Mahapatra, S. (2014) Trap Generation in IL and HK layers during BTI/TDDB stress in scaled HKMG N and P MOSFETs In: 2014 IEEE International Conference on Reliability Physics Symposium, 1-5 June, 2014, Waikoloa, HI, USA.

Joshi, K. ; Hung, S. ; Mukhopadhyay, S. ; Chaudhary, V. ; Nanaware, N. ; Rajamohnan, B. ; Sato, T. ; Bevan, M. ; Wei, A. ; Noori, A. ; McDougal, B. ; Ni, C. ; Saheli, G. ; Lazik, C. ; Liu, P. ; Chu, D. ; Date, L. ; Datta, S. ; Brand, A. ; Swenberg, J. ; Mahapatra, S. (2013) HKMG process impact on N, P BTI: Role of thermal IL scaling, IL/HK integration and post HK nitridation In: 2013 IEEE International Conference on Reliability Physics Symposium (IRPS), 14-18 April, 2013, Anaheim, CA, USA.

Desai, S. ; Mukhopadhyay, S. ; Goel, N. ; Nanaware, N. ; Jose, B. ; Joshi, K. ; Mahapatra, S. (2013) A comprehensive AC/DC NBTI model: Stress, recovery, frequency, duty cycle and process dependence In: 2013 IEEE International Conference on Reliability Physics Symposium (IRPS), 14-18 April, 2013, Anaheim, CA, USA.

Mahapatra, S. ; Islam, A. E. ; Deora, S. ; Maheta, V. D. ; Joshi, K. ; Alam, M. A. (2011) Characterization and modeling of NBTI stress, recovery, material dependence and AC degradation using R-D framework In: 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 4-7 July, 2011, Incheon, South Korea.

Mahapatra, S. ; Islam, A. E. ; Deora, S. ; Maheta, V. D. ; Joshi, K. ; Jain, A. ; Alam, M. A. (2011) A critical re-evaluation of the usefulness of R-D framework in predicting NBTI stress and recovery In: 2011 IEEE International Conference on Reliability Physics Symposium (IRPS), 10-14 April, 2011, Monterey, CA, USA.