Items where Author is "Jha, N."
Group by: Item Type | No Grouping Number of items: 1. Jha, N. ; Reddy, P. S. ; Sharma, D. K. ; Rao, V. R. (2005) NBTI degradation and its impact for analog circuit reliability IEEE Transactions on Electron Devices, 52 (12). pp. 2609-2615. ISSN 0018-9383 |
| Login | Create Account |
