Items where Author is "Gokhale, Shubha"

Article

Lobo, Arun ; Gokhale, Shubha ; Kulkarni, S. K. (2001) Surface morphology and electronic structure of Ge/Si(1 1 1) 7×7 system Applied Surface Science, 173 (3-4). pp. 270-281. ISSN 0169-4332

Vedpathak, Mahesh ; Basu, Saibal ; Gokhale, Shubha ; Kulkarni, S. K. (1998) Studies with Ni/Ti multilayer films using X-ray photoelectron spectroscopy and neutron reflectometry: microscopic characterization of structure and chemical composition Thin Solid Films, 335 (1-2). pp. 13-18. ISSN 0040-6090

Gokhale, Shubha ; Barman, S. R. ; Sarma, D. D. (1995) Dielectric function and optical conductivity of TiO_x (0.8 < x < 1.3) determined from electron energy-loss spectroscopy Physical Review B: Condensed Matter and Materials Physics, 52 (20). pp. 14526-14530. ISSN 1098-0121

Kundu, Manisha ; Mahamuni, Shailaja ; Gokhale, Shubha ; Kulkarni, S. K. (1993) Chemical reactivity and band offset at the CdS/Si interface Applied Surface Science, 68 (1). pp. 95-102. ISSN 0169-4332

Gokhale, Shubha ; Mahamuni, Shailaja ; Joshi, Kiran ; Nigavekar, A. S. ; Kulkarni, S. K. (1991) Chemical interaction at the Tm/Si(111) interface Surface Science, 257 (1-3). pp. 157-166. ISSN 0039-6028

Gokhale, Shubha ; Mahamuni, Shailaja ; Deshmukh, S. V. ; Rao, V. J. ; Nigavekar, A. S. ; Kulkarni, S. K. (1990) Photoemission and x-ray diffraction study of the Er/Si(111) interface Surface Science, 237 (1-3). pp. 127-134. ISSN 0039-6028

Gokhale, Shubha ; Ahmed, Nehal ; Mahamuni, Shailaja ; Rao, V. J. ; Nigavekar, A. S. ; Kulkarni, S. K. (1989) XPS and XRD investigations of Dy/Si interface Surface Science, 210 (1-2). pp. 85-98. ISSN 0039-6028