Items where Author is "Ghanashyam Krishna , M."

Article

Vasu, K. ; Ghanashyam Krishna, M. ; Padmanabhan, K. A. (2011) Conductive-atomic force microscopy study of local electron transport in nanostructured titanium nitride thin films Thin Solid Films, 519 (22). pp. 7702-7706. ISSN 0040-6090

Jha, Menaka ; Kshirsagar, Sachin D. ; Ghanashyam Krishna, M. ; Ganguli, Ashok K. (2011) Growth and optical properties of chromium borate thin films Solid State Sciences, 13 (6). pp. 1334-1338. ISSN 1293-2558

Kiran, M. S. R. N. ; Ghanashyam Krishna, M. ; Padmanabhan, K. A. (2011) Substrate-dependent structure, microstructure, composition and properties of nanostructured TiN films Solid State Communications, 151 (7). pp. 561-563. ISSN 0038-1098

Vasu, K. ; Ghanashyam Krishna, M. ; Padmanabhan, K. A. (2011) Substrate-temperature dependent structure and composition variations in RF magnetron sputtered titanium nitride thin films Applied Surface Science, 257 (7). pp. 3069-3074. ISSN 0169-4332

Sitarama Raju, K. ; Ghanashyam Krishna, M. ; Padmanabhan, K. A. ; Subramanya Sarma, V. ; Gurao, N. P. ; Wilde, G. (2011) Microstructure evolution and hardness variation during annealing of equal channel angular pressed ultra-fine grained nickel subjected to 12 passes Journal of Materials Science, 46 (8). pp. 2662-2671. ISSN 0022-2461

Kiran, M. S. R. N. ; Ghanashyam Krishna, M. ; Padmanabhan, K. A. (2008) Growth, surface morphology, optical properties and electrical resistivity of ε-TiN_x (0.4<x≤=0.5) films Applied Surface Science, 255 (5). pp. 1934-1941. ISSN 0169-4332

Sitarama Raju, K. ; Ghanashyam Krishna, M. ; Padmanabhan, K. A. ; Muraleedharan, K. ; Gurao, N. P. ; Wilde, G. (2008) Grain size and grain boundary character distribution in ultra-fine grained (ECAP) nickel Materials Science and Engineering: A, 491 (1-2). pp. 1-7. ISSN 0921-5093

Vasu, K. ; Kiran, M. S. R. N. ; Ghanashyam Krishna, M. ; Padmanabhan, K. A. (2008) Effect of substrate on the crystallographic texture and microstructure evolution in Titanium Nitride thin films Solid State Physics, 53 . p. 681. ISSN 0081-1947

Kiran, M. S. R. N. ; Ghanashyam Krishna , M. ; Padmanabhan, K.A. (2008) Interfacial engineering of nanostructured titanium nitride thin filmsn International Journal of Nanomanufacturing , 2 (5). pp. 420-441. ISSN 1746-9392

Ghanashyam Krishna, M. ; Kapoor, A. K. ; Durga Prasad, M. ; Srinivasan, V. (2006) The transition from bulk to nano as a phase transition Physica E: Low-dimensional Systems and Nanostructures, 33 (2). pp. 359-362. ISSN 1386-9477

Prasad, G. K ; Radhakrishnan, T. P. ; Sravan Kumar, D. ; Ghanashyam Krishna, M. (2005) Ammonia sensing characteristics of thin film based on polyelectrolyte templated polyaniline Sensors and Actuators B: Chemical, 106 (2). pp. 626-631 . ISSN 0925-4005