Items where Author is "Ganguly, U."

Article

Sandhya, C. ; Ganguly, U. ; Chattar, N. ; Olsen, C. ; Seutter, S. M. ; Date, L. ; Hung, R. ; Vasi, J. M. ; Mahapatra, S. (2009) Effect of SiN on Performance and Reliability of Charge Trap Flash (CTF) under Fowler–Nordheim tunneling program/erase operation IEEE Electron Device Letters, 30 (2). pp. 171-173. ISSN 0741-3106

Karmaker, S. ; Ghosh, A. N. ; Dey, D. ; Nair, G. B. ; Ganguly, U. (1994) Ultrastructural changes in HeLa cells associated with enteroadherent Escherichia coli isolated from infants with diarrhoea in Calcutta Journal of Diarrhoeal Disease Research, 12 (4). pp. 274-278. ISSN 0253-8768

Conference or Workshop Item

Sandhya, C. ; Ganguly, U. ; Singh, K. K. ; Singh, P. K. ; Olsen, C. ; Seutter, S. M. ; Hung, R. ; Conti, G. ; Ahmed, K. ; Krishna, N. ; Vasi, J. ; Mahapatra, S. (2008) Nitride engineering and the effect of interfaces on Charge Trap Flash performance and reliability In: 2008 IEEE International Reliability Physics Symposium, IRPS 2008, 27 April-1 May, 2008, Phoenix, AZ, USA.

Sandhya, C. ; Ganguly, U. ; Singh, K. K. ; Olsen, C. ; Seutter, S. M. ; Conti, G. ; Ahmed, K. ; Krishna, N. ; Vasi, J. ; Mahapatra, S. (2008) The effect of band gap engineering of the nitride storage node on performance and reliability of charge trap flash In: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2008, 7-11 July, 2008, Singapore, Singapore.

Nainani, A. ; Palit, S. ; Singh, P. K. ; Ganguly, U. ; Krishna, N. ; Vasi, J. ; Mahapatra, S. (2007) Development of A 3D simulator for metal Nanocrystal (NC) flash memories under NAND operation In: 2007 IEEE International Electron Devices Meeting, IEDM 2007, 10-12 Dec, 2007, Washington, DC, USA.