Items where Author is "Conti, G."Group by: Item Type | No Grouping Jump to: Conference or Workshop Item Number of items: 2. Conference or Workshop ItemSandhya, C. ; Ganguly, U. ; Singh, K. K. ; Singh, P. K. ; Olsen, C. ; Seutter, S. M. ; Hung, R. ; Conti, G. ; Ahmed, K. ; Krishna, N. ; Vasi, J. ; Mahapatra, S. (2008) Nitride engineering and the effect of interfaces on Charge Trap Flash performance and reliability In: 2008 IEEE International Reliability Physics Symposium, IRPS 2008, 27 April-1 May, 2008, Phoenix, AZ, USA. Sandhya, C. ; Ganguly, U. ; Singh, K. K. ; Olsen, C. ; Seutter, S. M. ; Conti, G. ; Ahmed, K. ; Krishna, N. ; Vasi, J. ; Mahapatra, S. (2008) The effect of band gap engineering of the nitride storage node on performance and reliability of charge trap flash In: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2008, 7-11 July, 2008, Singapore, Singapore. |

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