Items where Author is "Bude, J. D."

Article

Nair, D. R. ; Mahapatra, S. ; Shukuri, S. ; Bude, J. D. (2005) Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operation IEEE Transactions on Electron Devices, 52 (4). pp. 534-540. ISSN 0018-9383

Nair, D. R. ; Mahapatra, S. ; Shukuri, S. ; Bude, J. D. (2004) Drain disturb during CHISEL programming of NOR flash EEPROMs-physical mechanisms and impact of technological parameters IEEE Transactions on Electron Devices, 51 (5). pp. 701-707. ISSN 0018-9383

Nair, D. R. ; Mohapatra, N. R. ; Mahapatra, S. ; Shukuri, S. ; Bude, J. D. (2004) Effect of P/E cycling on drain disturb in flash EEPROMs under CHE and CHISEL operation IEEE Transactions on Device and Materials Reliability, 4 (1). pp. 32-37. ISSN 1530-4388

Mohapatra, N. R. ; Nair, D. R. ; Mahapatra, S. ; Ramgopal Rao, V. ; Shukuri, S. ; Bude, J. D. (2003) CHISEL programming operation of scaled NOR flash EEPROMs-effect of voltage scaling, device scaling, and technological parameters IEEE Transactions on Electron Devices, 50 (10). pp. 2104-2111. ISSN 0018-9383