Items where Author is "Bude, J."

Article

Mohapatra, N. R. ; Mahapatra, S. ; Rao, V. R. ; Shukuri, S. ; Bude, J. (2003) Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs Proceedings of the International Reliability Physics Symposium (IRPS) 2003, Dallas, Texas, USA . pp. 518-522.

Mahapatra, S. ; Shukuri, S. ; Bude, J. (2002) CHISEL flash EEPROM. I. Performance and scaling IEEE Transactions on Electron Devices, 49 (7). pp. 1296-1301. ISSN 0018-9383

Mahapatra, S. ; Shukuri, S. ; Bude, J. (2002) CHISEL flash EEPROM. II. Reliability IEEE Transactions on Electron Devices, 49 (7). pp. 1302-1307. ISSN 0018-9383

Conference or Workshop Item

Nair, D. R. ; Mahapatra, S. ; Shukuri, S. ; Bude, J. (2004) Multi-level programming of NOR flash EEPROMs by CHISEL mechanism In: 2004 42nd Annual IEEE International Reliability Physics Symposium Proceedings, 25-29 April, 2004, Phoenix, AZ, USA.

Mohapatra, N. R. ; Mahapatra, S. ; Rao, V. R. ; Shukuri, S. ; Bude, J. (2003) Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs In: 41st Annual 2003 IEEE International Reliability Physics Symposium Proceedings, 30 March-4 April, 2003, Dallas, TX, USA.

Nair, D. R. ; Mohapatra, N .R. ; Mahapatra, S. ; Shukuri, S. ; Bude, J. (2003) The effect of CHE and CHISEL programming operation on drain disturb in flash EEPROMs In: Proceedings of the 2003 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2003, 11-11 July, 2003, Singapore, Singapore.