Items where Author is "Anandkrishnan, R."Group by: Item Type | No Grouping Jump to: Article Number of items: 1. ArticleKumar, Satyam ; Anandkrishnan, R. ; Parihar, Narendra ; Mahapatra, Souvik (2020) A Stochastic Framework for the Time Kinetics of Interface and Bulk Oxide Traps for BTI, SILC, and TDDB in MOSFETs IEEE Transactions on Electron Devices, 67 (11). pp. 4741-4748. ISSN 0018-9383 |
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