Dielectric relaxation in oxide glasses

Saha, Shyamal Kumar ; Chakravorty, Dipankar (1992) Dielectric relaxation in oxide glasses Japanese Journal of Applied Physics, 31 . pp. 3642-3648. ISSN 0021-4922

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Official URL: http://jjap.jsap.jp/link?JJAP/31/3642/

Related URL: http://dx.doi.org/10.1143/JJAP.31.3642

Abstract

Dielectric relaxation spectra of lithia-containing silicate glasses and V2O5-P2O5 glasses respectively have been analysed using a heterophase conductor model developed recently. The model considers the glass as comprising diagonal layers of phases having widely different electrical conductivities. The conducting phase is assumed to have a local conductivity varying sinusoidally with the spatial co-ordinate. Excellent agreement between the experimental data and the theoretical values have been obtained over a broad frequency spectrum. The Kohlrausch-Williams-Watts (KWW) exponent has also been estimated for all the glasses. The exponent appears to be related to the conductivity fluctuation-a higher value of the latter leading a lower value of and vice versa.

Item Type:Article
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ID Code:64922
Deposited On:15 Oct 2011 12:44
Last Modified:15 Oct 2011 12:44

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