Sanyal, M. K. (1998) X-ray scattering studies of surfaces and interfaces Radiation Physics and Chemistry, 51 (4-6). pp. 487-495. ISSN 0969-806X
Full text not available from this repository.
Official URL: http://www.sciencedirect.com/science/article/pii/S...
Related URL: http://dx.doi.org/10.1016/S0969-806X(97)00184-9
Abstract
Here we shall briefly review the basics and some applications of X-ray specular reflectivity and diffuse scattering techniques. These X-ray scattering techniques are uniquely suited to study of the structure of surfaces and interfaces at atomic resolutions as they are nondestructive and can probe even interfaces which are buried. The study of structure of surfaces and interfaces is not only required in understanding physics in reduced dimensions but is also essential in developing technologically important materials.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 61347 |
| Deposited On: | 15 Sep 2011 03:43 |
| Last Modified: | 15 Sep 2011 03:43 |
Repository Staff Only: item control page
