Mukherjee, M. ; Bhattacharya, M. ; Sanyal, M. K. ; Geue, Th. ; Grenzer, J. ; Pietsch, U. (2002) Reversible negative thermal expansion of polymer films Physical Review E, 66 (6). 061801_1-061801_4. ISSN 1063-651X
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Official URL: http://pre.aps.org/abstract/PRE/v66/i6/e061801
Related URL: http://dx.doi.org/10.1103/PhysRevE.66.061801
Abstract
A basic understanding of the properties of thin polymer films is of fundamental importance for developing applications in nanotechnology. Results of energy and angle dispersive X-ray reflectivity measurements on polymer thin films as a function of temperature exhibit reversible negative thermal expansion below the glass transition temperature Tg. Above Tg, the thickness expansion becomes almost equal to the expected bulk volume expansion. These results could be explained on the basis of evolution of disorder with temperature at the interfaces, chain entanglement and associated entropy changes.
Item Type: | Article |
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Source: | Copyright of this article belongs to The American Physical Society. |
ID Code: | 61327 |
Deposited On: | 15 Sep 2011 03:46 |
Last Modified: | 15 Sep 2011 03:46 |
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