Arvind Singh, R. ; Sood, A. K. ; Jayaram, V. ; Biswas, S. K. (1998) Analysis of microresidual stresses in 6H-SiC particles within Al2O3-SiC-(Al,Si) CMC using Raman spectroscopy Scripta Materialia, 38 (4). pp. 617-622. ISSN 1359-6462
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Official URL: http://www.sciencedirect.com/science/article/pii/S...
Related URL: http://dx.doi.org/10.1016/S1359-6462(97)00518-6
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| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 50229 |
| Deposited On: | 22 Jul 2011 13:50 |
| Last Modified: | 22 Jul 2011 13:50 |
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